Hysitron #TI-900, TriboIndenter, 0.625 mm x 0.55 mm max Field of View, 250 mm x 150 mm X & Y Stages Travel, 50 mm Z Stage Travel

Description

Hysitron TI 900 TriboIndenter

Inventory # 9566-P

Model: TI 900

Description:

Hysitron offers in-situ scanning probe microscopy (SPM) imaging standards with each nanomechanical testing instrument. The in-situ SPM imaging capability of the TI 900 TriboIndenter is critical for precise test placement and microstructure identification

The in-situ images are obtained by raster scanning the indenter probe over the sample surface to allow for pre- and post-test observation of the material surface. This feature provides the capability to position the indenter probe within ten nanometers of the desired testing location. Identification and characterization of phases in multiphase materials or fine sample surface features can only be reliably carried out by employing in-situ SPM imaging

Posttest imaging also provides the ability to verify that the test was performed in the anticipated location, which maximizes the reliability of data and aids in the explanation of unexpected test results

Specifications:

Optics Specifications:

Normal Field of View:

Maximum: 0.625mm x 0.550mm (625 µm x 550 µm)

Minimum: 0.028mm x 0.022mm (28 µm x 22 µm)

Magnification:

Optical: 20x

Digital Zoom: 0.5x – 11x

Effective: 10x – 220x

Transducer Specifications:

Load:

Resolution: <1 nN

Noise Floor: 100 nN

Displacement:

Resolution: 0.0004 nm

Noise Floor: 0.2 nm

Drift: <0.05 nm/sec.

Stage Specifications:

X and Y Stages:

Travel: 250 mm x 150 mm

Encoder Resolution: 500 nm

Z Stage:

Travel: 50 mm

Resolution: 3 nm

Standard Features:

Hysitron’s patented capacitive transducer provides industry-leading sensitivity and stability

Automated testing for high throughput and statistical sampling of materials

In-situ imaging provides nanometer precision positioning and the convenience of SPM topography

Acoustic and thermal enclosure, along with stable transducer design, minimizes set-up and stabilization of time

Top-down optics for viewing and selection of testing sites

Sub-micron resolution staging for sample positioning

Numerous add-ons that allow the widest array of testing capabilities on the market

Active vibration-dampening systems ensure low noise and uncompromised sensitivity

FOB Our Baltimore, MD Warehouse

Please Note: This Machine is Being Sold As-Is, As-Inspected with No Warranty and No Return Privilege